DEVICE TESTING

KCB Solutions is fully capable of testing a wide variety of DC and RF parameters. These parameters include:

Small Signal RF (DC to 20 GHz)

- Insertion Loss - Phase
- VSWR - Gain
- Isolation - Impedance
- Group Delay - S-Parameters

Large Signal RF (DC to 20 GHz)

- Compression Point
- Intermodulation (Ip2, Ip3)

DC Parameters

- Device current
- Switching speed – Rise/Fall Time, Ton/Toff
- Device Characterization

• BJT Characterization – ICBO, IEBO, HFE, ΘJC etc.
  
  
• FET - Idss, VBRgdo, Igso, etc.

Temperature Characteristics - KCB has full electrical test capability from -55˚C to 125 ˚C.

Test Fixture Design

RF measurements can be difficult to make, particularly at higher frequencies. KCB engineering personnel are well equipped to design custom test fixtures that accurately measure product. KCB personnel also have the skills necessary to accurately de-embed test fixture effects on device measurements.

Automated Test

KCB implements 100 percent automated testing on all products. The Agilent VEE based software collects data on each device and stores it in Excel spreadsheet from for future analysis and can be supplied upon request. Statistical analysis (min, max, mean, Cpk) can also be applied by product to ensure that manufacturing processes are under control.